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Near-field light scattering in nanoptics and technology Prev topic | Next topic

Until the 1990’s most of the literature on optical scattering was mainly concerned with the study of far-field quantities, such as the electric field intensity at infinite distance from the scatterer (for example, Born M and Wolf 1999, Ravey JC and Mazeron 1982, Asano S and Yamamoto 1975). Since then, scattering in the near-field, i.e. within a distance of few wavelengths from the scatterer surface is increasingly attracting attention. This recent interest was sparked by (1) technological advances in nano-optics (Novotny L and Hecht 2006, Girard C and Dereux 1996) spawning novel techniques for fabricating and probing sub-wavelength structures, and (2) novel applications in nanotechnology that can benefit from the enhanced local fields in the vicinity of scattering particles. Such applications include high-resolution spectroscopy imaging (e.g., luminescence enhancement, Mertens H et al 2007), localized sensing methods (e.g., surface enhanced Raman spectroscopy – SERS, Cline MP et al 1986), and novel photovoltaic cell designs (e.g., intermediate-band solar cells – IBSC, Mendes MJ et al 2009).

Related topics: Near-field scattering in photovoltaics, Near-field light enhancement in the electrostatic regime, Near-field light enhancement in the intermediate regime at forward scattering, A scattering particle as an antenna

CITATION:
Mendes M. J. 2010. Near-field light scattering in nanoptics and technology (www.tpdsci.com/Tpc/ScaNfNnOptTech.php). In: Top. Part. Disp. Sci. (www.tpdsci.com).
HISTORY:
Published: 01-Dec-2010
Modified: 01-Dec-2010
Peer-reviewed: 30-Nov-2010
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