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Development in the field of microfabrication technology has led to experimental devices counters based on the electrical resistance measurement principle. Saleh and Sohn (2001) describe such a device capable of counting particles as small as 87 nm.
| CITATION: Jonasz M. 2006. Electrical resistance nanoparticle counter on microchip (www.tpdsci.com/Tpc/ERMChip.php). In: Top. Part. Disp. Sci. (www.tpdsci.com). |
HISTORY: Published: 22-Feb-2006 Modified: 20-Jun-2006 Peer-reviewed: PENDING |
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