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• Zabezhailov MO
• Zaccanti G
• Zaccone A
• Zakery A
• Zakharova NT
• Zakian C
• Zakovic S
• Żakowicz W
• Zaneveld JRV
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• Zasetsky AY

J. Ronald V. Zaneveld

WET Labs, Philomath, Oregon, USA

TPDSci reviewer

Publications: Bartz R et al 1978, Beardsley GF and Zaneveld 1969, Bogucki DJ et al 1998, Kitchen JC and Zaneveld 1992, Kitchen JC et al 1975, Moore C et al 2000, Pegau WS et al 1997, 1995b, 1995a, Pegau WS and Zaneveld 1994, 1993, Piskozub J et al 2000, Spinrad RW et al 1998, Sullivan JM et al 2006, Twardowski MS et al 2001, Zaneveld JRV

Zaneveld J. R. V., Kitchen J. C. 1995. The variation in the inherent optical properties of phytoplankton near an absorption peak as determined by various models of cell structure. J. Geophys. Res. C 100, 13,309-13,320. [source]

Zaneveld J. R. V., Kitchen J. C., Moore C. M. 1994. Scattering error correction of reflecting-tube absorption meters. Proc. SPIE 2258, 44-55. [source]

Zaneveld J. R. V., Bartz R., Kitchen J. C. 1990. Reflective-tube absorption meter. In: Ocean Optics X. Spinrad R. W. (ed.) Proc. SPIE 1302, 124-136. [source]

Zaneveld J. R. V., Bartz R. 1984. Beam attenuation and absorption meters. In: Ocean Optics VII. Proc. SPIE 489, 318-324.

Zaneveld J. R. V., Spinrad R. W., Bartz R. 1979. Optical properties of turbidity standards. In: Ocean Optics VI. Duntley S. Q. (ed.), Proc. SPIE 208, 159-168.