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John W. Pyhtila

Publications: Keener JD et al 2007, Pyhtila JW

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Pyhtila J. W., Wax A. 2007. Polarization effects on scatterer sizing accuracy analyzed with frequency-domain angle-resolved low-coherence interferometry. Appl. Opt. 46, 1735-1741. [source]

Pyhtila J., Graf R., Wax A. 2003. Determining nuclear morphology using an improved angle-resolved low coherence interferometry system. Opt. Express 11, 3473-3484. [source, pdf]

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