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Dennis C. Prieve

Department of Chemical Engineering, Carnegie Mellon University, Pittsburgh, Pennsylvania, USA

Publications: Min GK et al 2002, Prieve DC

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Prieve D. C., Walz J. Y. 1993. The scattering of an evanescent surface wave by a dielectric sphere in total internal reflection microscopy. Appl. Opt. 32, 1629-1641. [source]

Prieve D. C., Frej N. A. 1990. Total internal reflection microscopy: A quantitative tool for the measurement of colloidal forces. Langmuir 6, 396-403. [source]

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