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Joaquín Campos Acosta

Measurement of Optical Radiation, Department of Metrology, Institute of Applied Physics (Grupo de Investigación en Medidas de Radiación Óptica, Departamento de Metrología, Instituto de Física Aplicada) Madrid, Spain

Publications: Campos J

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Campos J., Corronos A., Pons A. 1988. Response uniformity of silicon photodiodes. Appl. Opt. 27, 5154-5156. [source]

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