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Publications: Albella P
Albella P., Saiz J. M., Sanz J. M., González F., Moreno F. 2009. Nanoscopic surface inspection by analyzing the linear polarization degree of the scattered light. Opt. Lett. 34, 1906-1908. [find in index, source]
Albella P., Moreno F., Saiz J. M., González F. 2008. Surface inspection by monitoring spectral shifts of localized plasmon resonances. Opt. Express 16, 12872-12879. [find in index, source, pdf]
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